Examination Pattern for AIEEE 2012 Examination
Entrance examination would consist of two papers i.e.
- 1st paper consisting of three parts of Physics, Chemistry and Mathematics of equal weightage with objective type questions for B.E/B.Tech courses and
- 2nd paper consisting of Mathematics, Aptitude Test and Drawing for B. Architecture and B. Planning.
- The Aptitude Test is designed to evaluate candidate’s perception, imagination, observation, creativity and architectural awareness.
Scoring and Negative Marking:
There will be objective type questions with four options having single correct answer. For each incorrect response, one fourth (1/4) of the total marks allotted to the question would be deducted. No deduction from the total score will, however, be made if no response is indicated for an item in the answer sheet. The candidates are advised not to attempt such item in the answer sheet if they are not sure of the correct response. More than one answer indicated against a question will be deemed as incorrect response and will be negatively marked.
Subject combination for each paper and type of questions in each paper are given in the table below:
| SUBJECTS | TYPE OF QUESTIONS | |
| Paper 1 |
Physics, Chemistry & Mathematics | Objective type questions with equal weightage to Physics, Chemistry & Mathematics |
| Paper 2 | Mathematics – Part I Aptitude Test – Part II & Drawing Test – Part III |
Objective type questions Objective type questions Questions to test Drawing Aptitude |
AIEEE 2012 Preparation Resources:
- AIEEE 2012 Pattern Based Free Practice Paper
- AIEEE Previous year Paper with Solutions
- PCM Study Doubts
- AIEEE Syllabus
- AIEEE Question Papers
Other Related Links :
- AIEEE 2012
- AIEEE 2012 Exam Pattern
- AIEEE 2012 Notification
- AIEEE 2012 Syllabus
- AIEEE 2012 Eligibility Criteria
- AIEEE 2012 Application Submission Process
- AIEEE 2012 Application Form Status
- AIEEE 2012 Important Dates
- AIEEE 2012 Answer Key
- AIEEE 2012 Result
- AIEEE 2012 Counseling
- AIEEE 2012 Cutoff
- AIEEE 2012 FAQ
- AIEEE 2011 Archives
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